WO9300560-A1  PATENT ABSTRACTS OF JAPAN vol. 6, no. 253 (M-178)(1131) 11 December 1982 & JP,A,57 148 138 ( NIHON ARUMINIUMU KOGYO KK ) 13 September 1982;  See also references of EP 0591375A1;  PATENT ABSTRACTS OF JAPAN vol. 6, no. 253 (M-178)(1131) 11 December 1982&JP,A,57 148 138 ( NIHON ARUMINIUMU KOGYO KK ) 13 September 1982EP591375-A1  See references of WO 9300560A1;  See references of WOA 9300560;  See also references of WO 9300560A1US5336558-A  J. Mat. Sci., 25, 1990, pp. 5257-5268, Y. Sadaoka, T. A. Jones, G. S. Revell, W. Gopel;  J. Vac. Sci. Technol B, 8, (6), Nov.Dec., 1990, pp. 1199-1211, G. S. Oehrlein, J. F. Rembetski, and E. H. Payne;  J. Vac. Sci. Technol. A, 1, (3), Jul.Sep., 1983, pp. 1398-1402 J. A. Floro, S. M. Rossnagel, and R. S. Robinson;  J. Vac. Sci. Technol. A, 5, (4), Jul.Aug., 1987, pp. 1914-1916, K. K. Kam, M. K. Debe, R. J. Poirier, and A. R. Drube;  J. Vac. Sci. Technol. A, 6, (3), MayJun., 1988, pp. 1907-1911, M. K. Debe, K. K. Kam, J. C. Liu, and R. J. 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LeamyEP591375-B1  PATENT ABSTRACTS OF JAPAN vol. 6, no. 253 (M-178)(1131) 11/12/1982 & JP-A-57 148 138 (NIHON ARUMINIUMU KOGYO KK) 13/09/1982US5645929-A  "Measurement and Modeling of the Reflectance-Reducing Properties of Gradient Index Microstructured Surfaces," P.K. Lee and M.K. Debe, Photographic Science and Engineering, vol. 24, No. 4, Jul.Aug. 1980, pp. 211-216.;  J. Mat. Sci., 25, 1990, pp. 5257-5268, Y. Sadaoka, T.A. Jones, G.S. Revell, W. Gopel.;  J. Vac. Sci. Techno. A, 6, (3), MayJun., 1988, pp. 1907-1911, M.K. Debe, K.K. Kam, J.C. Liu, and R.J. Poirier.;  J. Vac. Sci. Technol B, 8 (6), Nov.Dec., 1990, pp. 1199-1211, G.S. Oehrlein, J.F. Rembetski, and E.H. Payne.;  J. Vac. Sci. Technol. A, 1, (3), Jul.Sep., 1983, pp. 1398-1402 J.A. Floro, S.M. Rossnagell, and R.S. Robinsin.;  J. Vac. Sci. Technol. A, 5, (4), Jul.Aug., 1987, pp. 1914-1916, K.K. Kam, M.K. Debe, R.J. Poirier, and A. R. Drube.;  Rapidly Quenced Metals (Proc. of the Fifth Int. 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