WO200054031-A  LA ROSA A H ET AL: "Optical imaging of carrier dynamics in silicon with subwavelength resolution" APPL PHYS LETT;APPLIED PHYSICS LETTERS MAR 31 1997 AMERICAN INST OF PHYSICS, WOODBURY, NY, USA, Bd. 70, Nr. 13, 31. Maerz 1997 (1997-03-31), Seiten 1656-1658, XP000689456;  LA ROSA ANDRES H ET AL: "Time-resolved contrast in near-field scanning optical microscopy of semiconductors" SCANNING PROBE MICROSCOPIES III;SAN JOSE, CA, USA FEB 6-7 95, Bd. 2384, 1995, Seiten 101-108, XP000917246 Proc SPIE Int Soc Opt Eng;Proceedings of SPIE - The International Society for Optical Engineering 1995 Society of Photo-Optical Instrumentation Engineers, Bellingham, WA, USA;  MORI Y ET AL: "Two-dimensional image detection of luminescence and transport properties of GaAs" PROCEEDINGS OF THE THIRD INTERNATIONAL SYMPOSIUM ON DEFECT RECOGNITION AND IMAGE PROCESSING IN III-V COMPOUNDS (DRIP III);TOKYO, JPN SEP 22-25 1989, Bd. 103, Nr. 1-4, 22. September 1989 (1989-09-22), Seiten 8-13, XP000917163 J Cryst Growth;Journal of Crystal Growth Jun 1990;  RODRIGUEZ M E ET AL: "Microelectronic circuit characterization via photothermal radiometry of scribeline recombination lifetime" SOLID STATE ELECTRONICS,GB,ELSEVIER SCIENCE PUBLISHERS, BARKING, Bd. 44, Nr. 4, Seiten 703-711, XP004202210 ISSN: 0038-1101WO200054031-A1  LA ROSA ANDRES H ET AL: &quot;Time-resolved contrast in near-field scanning optical microscopy of semiconductors&quot; SCANNING PROBE MICROSCOPIES III;SAN JOSE, CA, USA FEB 6-7 95, Bd. 2384, 1995, Seiten 101-108, XP000917246 Proc SPIE Int Soc Opt Eng;Proceedings of SPIE - The International Society for Optical Engineering 1995 Society of Photo-Optical Instrumentation Engineers, Bellingham, WA, USA;  MORI Y ET AL: &quot;Two-dimensional image detection of luminescence and transport properties of GaAs&quot; PROCEEDINGS OF THE THIRD INTERNATIONAL SYMPOSIUM ON DEFECT RECOGNITION AND IMAGE PROCESSING IN III-V COMPOUNDS (DRIP III);TOKYO, JPN SEP 22-25 1989, Bd. 103, Nr. 1-4, 22. September 1989 (1989-09-22), Seiten 8-13, XP000917163 J Cryst Growth;Journal of Crystal Growth Jun 1990;  RODRIGUEZ M E ET AL: &quot;Microelectronic circuit characterization via photothermal radiometry of scribeline recombination lifetime&quot; SOLID STATE ELECTRONICS,GB,ELSEVIER SCIENCE PUBLISHERS, BARKING, Bd. 44, Nr. 4, Seiten 703-711, XP004202210 ISSN: 0038-1101;  LA ROSA A H ET AL: &quot;Optical imaging of carrier dynamics in silicon with subwavelength resolution&quot; APPL PHYS LETT;APPLIED PHYSICS LETTERS MAR 31 1997 AMERICAN INST OF PHYSICS, WOODBURY, NY, USA, Bd. 70, Nr. 13, 31. M{rz 1997 (1997-03-31), Seiten 1656-1658, XP000689456