WO2004020688-A1  TAKAHASHI N. ET AL.: 'New vapor phase deposition of pyrite thin films using FeCl3 and Ch3CSNH2' JOURNAL OF MATERIALS SCIENCE LETTERS vol. 19, no. 24, 2000, pages 2223 - 2224, XP001025228;  TAKAHASHI N. ET AL.: 'Preparation of pyrite thin films by atomospheric pressure chemical vapor deposition using FeCl3 and CH3CSNH2' JOURNAL OF MATERIALS CHEMISTRY vol. 10, no. 10, 2000, pages 2346 - 2348, XP002976513DE10394037-B4  Journal of Crystal Growth, 151 (1995) S. 323-334;  N. Takahashi et Al.: Journal of Materials Science Letters, 2000, Vol. 10, Nr. 10, S. 2346-2348;  N. Takahashi et Al.: Journal of Materials Science Letters, 2000, Vol. 19, Nr. 24, S. 2223-2224;  Thin Solid Films 246(1994) S. 6-12US8337952-B2  Takahashi et al, Preparation of pyrite thin films by atmospheric pressure chemical vapor deposition using FeCI3 and CH3CSNH2, J. Mater. Chem., 2000, 10, p. 2346-2348.;  Schleich et al, Iron pyrite and iron marcasite thin films prepared by low pressure chemical vapor deposition, Journal of Crystal Growth, vol. 112, Issue 4, Jul. 1991, Abstract (2 pages).;  Sasaki et al, Iron pyrite thin film prepared by double source vacuum vapor deposition, Journal of Materials Science Letters 18 (1999), p. 1193-1195.;  Takahashi et al. ,&#x201c;New vapor phase deposition of pyrite thin films using FeCI3 and CH3CSNH2&#x201d;, Journal of Materials Science Letters 19:2223-2224 (2000).;  Takahashi et al.,&#x201c;Preparation of pyrite thin films by atmospheric pressure chemical vapor deposition using FeCI3 and CH3CSNH2&#x201d;, Journal of Materials Chemistry 10:2346-2348 (2000).;  Lichtenberger et al.,&#x201c;Structural optical and electrical properties of polycrystalline iron pyrite layers deposited by reactive d.c. magnetron sputtering&#x201d;, Thin Solid Films 246:6-12 (1994).;  H&#xf6;pfner et al.,&#x201c;Stoichiometry-, phase- and orientation-controlled growth of polycrystalline pyrite (FeS2) thin films by MOCVD&#x201d;, Journal of Crystal Growth 151:325-334 (1995).;  International Search Report corresponding to PCT/JP03/010814 mailed on Dec. 9, 2003.;  International Preliminary Examination Report corresponding to PCT/JP2003/010814 filed Aug. 27, 2003.