;  WO2006019658-A2 -- US3477917-A   ;  US3562116-A   PACTIDE CORP (PACT-Non-standard);  US3661721-A   PACTIDE CORP (PAC-Non-standard);  US20020144600-A1   ;  EP1781389-A2 -- JP2000005502-A   ;  US7610775-B2 -- CN1068973-A   CHANGCHUN INST APPLIED CHEM CHINESE ACAD (CAAC)   WU Y,  KONG Y,  XU J;  DE19812067-A1   ;  EP1362634-A1   JAPAN SCI&TECHNOLOGY CORP (JSTA)   HIGUCHI T,  TORII T,  NISHISAKO T,  TANIGUCHI T;  EP904608-B1   ZTEK CORP (ZTEK-Non-standard)   HSU M S,  HOAG E D;  EP1311341-B1   INST MIKROTECHNIK MAINZ GMBH (MIKR-Non-standard);  MGT MIKROGLAS TECH AG (MGTM-Non-standard)   LOEWE H,  SCHIEWE J,  HESSEL V,  DIETRICH T,  FREITAG A;  US3477917-A   ;  US3562116-A   PACTIDE CORP (PACT-Non-standard);  US3661721-A   PACTIDE CORP (PAC-Non-standard);  US4392362-A   LITTLE W A (LITT-Individual);  LELAND STANFORD JUN (STRI)   LITTLE W A;  US4516632-A   US DEPT ENERGY (USAT)   SWIFT G W,  MIGLIORI A,  WHEATLEY J C;  US4597947-A   US SEC OF ARMY (USSA)   ALMAULA B C;  US5309637-A   ROCKWELL INT CORP (ROCW)   MORIARTY M P; 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 WO2003106386-A2   VELOCYS INC (VELO-Non-standard)   BROPHY J H,  JAROSCH K,  MAZANEC T J,  TONKOVICH A L Y,  SCHMIDT M B,  SILVA L J,  PESA F;  WO2004052518-A2   EHRFELD MIKROTECHNIK AG (EHRF-Non-standard);  WO2004054013-A2   UOP LLC (UNVO);  RUSSELL B P (RUSS-Individual);  HARNESS J R (HARN-Individual);  BLOMMEL P G (BLOM-Individual);  SIOUI D R (SIOU-Individual);  ABDO S F (ABDO-Individual);  VANDEN BUSSCHE K M (BUSS-Individual);  SANGER R J (SANG-Individual)   RUSSELL B P,  HARNESS J R,  BLOMMEL P G,  SIOUI D R,  ABDO S F,  VANDEN BUSSCHE K M,  SANGER R J;  WO2004062792-A2   BRICKER M L (BRIC-Individual);  SACHTLER J W A (SACH-Individual);  MCGONEGAL C P (MCGO-Individual);  KRAWCZYK M A (KRAW-Individual);  ALEXANIAN A J (ALEX-Individual);  PLASSEN M (PLAS-Individual)   BRICKER M L,  SACHTLER J W A,  MCGONEGAL C P,  KRAWCZYK M A,  ALEXANIAN A J,  PLASSEN M;  WO2004067160-A2   MARTIN J L (MART-Individual)   MARTIN J L;  WO2004067708-A2   SRI INT (STRI)   KNAPP M A,  AGUERO V M,  JOSEPH J P,  LADEROUTE K R,  HEYDT R P,  MCCLOSKEY R; 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