TECHNOLOGY FOCUS - INORGANIC CHEMISTRY - Preferred Components: The carrier is copper, high-grade steel or aluminum.    TECHNOLOGY FOCUS - POLYMERS - Preferred Process: The sublayers are coated by lacquer process and optionally calcination process. The sublayers are applied on the carrier by different process. The coating of the sublayer (8) of the intermediate layer on the carrier containing aluminum, takes place by an anodic oxidation or an electrolytic brightening combined with an anodic oxidation. Preferred Components: The plastic is obtained on the basis of a solvent composition comprising acrylate-, epoxide- and/or polyurethane resin, as main components or acrylate phenol, epoxide phenol and/or polyurethane phenol. The intermediate layer further comprises further sublayers (8, 10). The chemical composition in each sublayers are different from each other. The sublayer (10) of the intermediate layer comprises an inorganic layer containing silicon dioxide, which is coated by wet-chemical- or sol-gel process, and exhibits a thickness preferably drying thickness of 0.5-3 microns. The intermediate layer exhibits a total thickness, preferably geometrical drying thickness of 1-80 microns. The metal infrared reflection layer consists of the metal in the absorption layer system. An adhesive layer is located on the intermediate layer under the infrared reflection layer. The reflection layer, an absorption layer system and reflection layer system (6) of the optical multi-layer system and adhesive sputtering layers, preferably reactive sputtering produced layers, chemical vapor deposition- or plasma enhanced chemical vapor deposition- layers are produced by evaporation, preferably by electron bombardment or thermal source, and preferentially in vacuum sequence in a continuous procedure. The width; and thickness of the material in the form of coil is up to 1650 mm, preferably 1400 mm; and 0.1-0.8 mm, respectively. The reflection layer system, as an uppermost layer on the optical system, minimizes the residual reflection of the incident radiation in the solar spectral region.