NOVELTY - A low reflection glass (10) has anti-reflective film (14), formed in surface of glass substrate (12). The anti-reflective film has outermost layer (18) and intermediate layer (16) containing silicon, carbon and oxygen. The intermediate layer includes layers (A) and (B). The layer (A) has extinction-coefficient of 0 to less than 0.1 measured at wavelength of 380-780 nm, and refractive index of 2-2.5 measured at wavelength of 550 nm. The layer (B) has extinction-coefficient of 0.1-2.4 and refractive index of 0.5-2.5 measured at wavelength of 380-780 nm.    USE - Low reflection glass is used for protective plate for plasma display (claimed). Can also be used for cover glass for solar cell, liquid crystal display and electroluminescent display, glass for motor vehicle, rail vehicle, vessel and building material.    ADVANTAGE - The low reflection glass has excellent abrasion resistance, weather resistance, productivity and external appearance.    DETAILED DESCRIPTION - A low reflection glass has glass substrate, and anti-reflective film formed in surface of the glass substrate. The anti-reflective film has intermediate layer and outermost layer arranged sequentially from glass-substrate side. The outermost layer contains silicon, carbon and oxygen. The content of carbon is 0.5-3 mol% with respect to 100 mol% of silicon, carbon and oxygen. The intermediate layer includes layers (A) and (B). The layer (A) has extinction-coefficient (K1) of 0 to less than 0.1 measured at wavelength of 380-780 nm, and refractive index (n1) of 2-2.5 measured at wavelength of 550 nm. The layer (B) has extinction-coefficient (K2) of 0.1-2.4 measured at wavelength of 380-780 nm and refractive index (n2) of 0.5-2.5 measured at wavelength of 380-780 nm. The extinction coefficient (K2p) of layer (B) measured at wavelength (p) is less than extinction coefficient (K2q) of layer (B) measured at wavelength (q), and satisfies following condition: 380(nm) less than or equal to p less than q less than or equal to 780(nm). The refractive index (n2p) of layer (B) measured at wavelength (p) is more than refractive index (n2q) of layer (B) measured at wavelength (q), and satisfies following condition: 380(nm) less than or equal to p less than q less than or equal to 780(nm).    DESCRIPTION OF DRAWING(S) - The drawing shows a sectional view of the low reflection glass.    Low reflection glass (10)    Glass substrate (12)    Anti-reflective film (14)    Intermediate layer (16)    Outermost layer (18)