NOVELTY - The nondestructive analytical method for determining the quality of a chalcopyrite based solar cell using photoluminescence measurements, comprises measuring photoluminescence spectrum for determining the electric characteristics of the solar cell initially and after the production of absorber layer at room temperature, subsequently analyzing a first peak related to its spectral position dominating the measured photoluminescence spectrum and comparing the peaks determined with the photoluminescence, with the measurement of open circuit voltage in dependent upon the spectral position.    USE - Nondestructive analytical method useful for determining quality of a chalcopyrite based solar cell using photoluminescence measurements.    ADVANTAGE - The method ensures efficient and accurate determination of the quality of a chalcopyrite based solar cell.    DETAILED DESCRIPTION - The nondestructive analytical method for determining the quality of a chalcopyrite based solar cell using photoluminescence measurements, comprises measuring photoluminescence spectrum for determining the electric characteristics of the solar cell initially and after the production of absorber layer at room temperature, subsequently analyzing a first peak related to its spectral position dominating the measured photoluminescence spectrum and comparing the peaks determined with the photoluminescence, with the measurement of open circuit voltage in dependent upon the spectral position, where the peaks are determined at the material sample of same type of absorber layer and the open circuit voltage is evaluated in dependent upon the known limit value. The analytical method is carried out after the application of zinc oxide layer on the absorber layer. The stimulation of the photoluminescence is carried out in the sample with laser light or white light. The stimulation wave length is smaller than the band gap of the absorber layer. The process is used for solar module in which the solar module is scanned with a photoluminescence measuring head mounted on a shifting unit and homogeneity cards are created for characterizing the solar module quality from the determined measuring data.    DESCRIPTION OF DRAWING(S) - The diagram shows a spectrum of a photoluminescence measurement of chalcopyrite copper indium sulfide after the application of the absorber layer (Drawing includes non-English language text).