NOVELTY - Forming a solar cell device comprises: (a) forming a portion of a solar cell device on substrates comprising depositing layers on a surface of each of the substrates; and (b) displaying a first label of a first data set and a second label of a second data set on a display device or storing a first label of a first data set and a second label of a second data set in memory.    USE - The methods are useful for forming a solar cell device (claimed).    DETAILED DESCRIPTION - Forming a solar cell device comprises: (a) forming a portion of a solar cell device on substrates comprising depositing layers on a surface of each of the substrates; (b) measuring a property of the deposited layers on each of the substrates; (c) manipulating the measured property data collected on each of the substrates to define a first data set; (d) manipulating the measured property data collected on each of the substrates to define a second data set; (e) assigning a first label to the first data set based on whether the first data set falls within a first range of measured values; (f) assigning a second label to the second data set based on whether the second data set falls within the first range of measured values; and (g) displaying the first label of the first data set and the second label of the second data set on a display device or storing the first label of the first data set and the second label of the second data set in memory. An INDEPENDENT CLAIM is included for an automated solar cell production line comprising: (a) a substrate loading station to load substrates into the integrated production line that comprises automation devices which are configured to serially transfer substrates along a path; (b) cluster tools disposed along the path and downstream from the substrate loading station, and having a processing chamber that is adapted to deposit a silicon-containing layer on a surface of the substrate; (c) a contact isolation module disposed along the path and downstream from the cluster tools, and adapted to etch at least a portion of the deposited silicon-containing layer to provide isolation between regions of the deposited silicon-containing layer; (d) a first inspection module positioned to measure a characteristic of a deposited silicon-containing layer and deliver the data to the system controller; (e) a system controller having memory and is in communication with the processing chamber and the front contact isolation module each module and configured to analyze information received from each module; and (f) a terminal used to graphically depict the data delivered to the system controller.