TECHNOLOGY FOCUS - ELECTRONICS - Preferred Method: In forming a solar cell device, the first data set comprises an average of a measured electrical characteristic over a first period of time, and the second data set comprises an average of the measured electrical characteristic over a second period of time. The first data set and the second data set each comprise a measured electrical characteristic selected from conversion efficiency, quantum efficiency, series resistance, fill factor, sheet resistance, open circuit voltage, dark current, short circuit current, maximum power, maximum current, maximum voltage, or photocurrent. The first label comprises a color, a display intensity value, or a pattern that is adapted to distinguish the measured electrical characteristics that fall within the first range of measured values and the measured electrical characteristics that do not fall within the first range. The measured properly is selected from a group properties comprising an optical characteristic of the deposited layer or an electrical property of the deposited layer. The first label of the first data set and the second label of the second data set provide information on the status of the previous performed deposition process. Depositing layers comprises forming a first p-i-n junction comprising: (i) forming a p-type amorphous silicon layer; (ii) forming an intrinsic type amorphous silicon layer over the p-type amorphous silicon layer; and (iii) forming an n-type silicon layer over the intrinsic type amorphous silicon layer; and the measuring a property of the deposited layers on each of the substrates further comprises: (i) delivering electromagnetic radiation to the portion of the solar cell device; and (ii) measuring an electrical characteristic of the formed first p-i-n junction. Forming a solar cell device comprises: (a) forming a portion of a solar cell device on substrates comprising depositing layers on a surface of each of the substrates; (b) measuring electrical characteristics of the layers on each of the substrates using two or more probes that are coupled to a measurement device; (c) analyzing the measured electrical characteristic collected on each of the substrates to determine whether each measured electrical characteristic on each substrate falls within a first range, where each of the analyzed measured electrical characteristics is assigned a first label based on whether it is within the first range; and (d) displaying each of the measured electrical characteristics on a display device or storing the measured electrical characteristics in memory. The method further comprises receiving the measured electrical characteristic data collected on each of the substrates. Forming a solar cell device comprises: (a) forming a first portion of a solar cell device on a first substrate in a first processing chamber that is disposed in a solar cell production line, comprising depositing a first layer on a surface of the first substrate; (b) depositing a second layer over the first layer in a second processing chamber that is disposed in the solar cell production line; (c) forming a first portion of a solar cell device on a second substrate in the first processing chamber, where forming the first portion of the solar cell device comprises depositing a third layer on a surface of a second substrate; (d) depositing a fourth layer over the third layer in a third processing chamber that is disposed in the solar cell production line; (e) measuring electrical characteristics of the first and second layers formed on the first substrate, and third and fourth layers formed on the second substrate; (f) forming a first portion of a solar cell device on a third substrate in the first processing chamber, where forming the first portion of the solar cell device comprises depositing a fifth layer on a surface of the third substrate; and (g) transferring the third substrate to the second processing chamber or the third processing chamber to deposit a sixth layer over the fifth layer, where a system controller causes the third substrate to be transferred to the either the second or third processing chambers based on the results of a comparison of the data received from the measured electrical characteristic of the first and second layers formed on the first substrate, and third and fourth layers formed on the second substrate. Preferred Automated Solar Cell Production Line: The system controller is further configured to take corrective action based on the received information. The first optical inspection module comprises an illumination source and inspection devices, and where the inspection devices are configured to capture an optical image of the substrate as it passes between the illumination source and the inspection devices. The automated solar cell production line further comprises a second optical inspection module having an illumination source and an inspection device, where the second optical inspection module is disposed in the solar cell production line downstream from the cluster tools and upstream from a back contact deposition module, and where the second optical inspection module is configured to capture an image of substrate having a silicon-containing layer thereon, and where the second optical inspection module is configured to send information regarding the image to the system controller.