NOVELTY - The device has a photovoltaic array (1) connected with a rapid capacitor charging main circuit that is provided with a voltage-sensitive resistor (2), a slow discharging resistor (3), a charging/discharging capacitor (4), a current sensor (8) and a voltage sensor (9). The current sensor and the voltage sensor perform analog/digital (A/D) conversion for a current sampling signal and a voltage sampling signal and send the current sampling signal and the voltage sampling signal to a TMS320F2812 type data collecting unit control chip (12) for analyzing and processing data collection.    USE - Photovoltaic array testing device for a photovoltaic system.    ADVANTAGE - The device utilizes the TMS320F2812 type high speed digital signal processor (DSP) control chip to test performance parameters of a photovoltaic array, and runs a predicting algorithm to confirm the photovoltaic array performance parameter of the photovoltaic array at any temperature and illumination condition according to scene measured data. The device utilizes a curve fitting method to get a feature curve of the photovoltaic array, reflects factual work situation of the photovoltaic array, and realizes ideal design effect. The DSP control chip has high precision, rapid speed and high integration. The device improves testing and predicting precision of region feature testing and predicting process of the photovoltaic array, provides high speed data sampling analysis, and completes complicate value operation. The device is light in weight, easy to maintain and convenient to use for measuring the photovoltaic array in areas.    DESCRIPTION OF DRAWING(S) - The drawing shows a schematic block diagram of a photovoltaic array testing device.'(Drawing includes non-English language text)'    Photovoltaic array (1)    Voltage-sensitive resistor (2)    Slow discharging resistor (3)    Charging/discharging capacitor (4)    Current sensor (8)    Voltage sensor (9)    TMS320F2812 type data collecting unit control chip (12)