NOVELTY - An antireflective material is a coating membrane containing binder, silica particles and air pocket, provided in at least one portion of a base material (1) surface having translucency. The silica particles are arranged in two layers from the base material surface, in which primary layer is a base material side having air pocket between the base material and silica particles, and secondary layer has a structure having air pocket (4b) between the primary layer silica particles (3a) and secondary layer silica particles (3b).    USE - Antireflective material is used for organic electroluminescent element, liquid crystal display, plasma display panel, display portion of display apparatus, building or glass window of motor vehicle, surface layer of traffic sign light source, light-emitting diode element, front light, solar cell panels, cover of polarizing plate, diffraction grating, wavelength filter, light-guide plate, light-diffusion film, sub wavelength light study element, color filter, light-condensing sheet and lighting fixture.    ADVANTAGE - The antireflective material has improved efficiency, and is produced by one coating.    DETAILED DESCRIPTION - An antireflective material is a coating membrane containing binder, silica particles and air pocket, provided in at least one portion of a base material surface having translucency. The silica particles are arranged in two layers from the base material surface, in which primary layer is a base material side having air pocket between the base material and the silica particles in which particles are spread, and secondary layer has a structure having air pocket between the primary layer silica particles and secondary layer silica particles, and silica particles which covers a portion of the primary layer silica particles. The average particle diameter of the silica particles is 50-180 nm. The peak wavelength of a reflected wave form is adjusted to long-wavelength side, by enlarging average particle diameter of silica particles, or by increasing abundance-ratio of number of silica particles of secondary layer with respect to number of silica particles of primary layer, or the peak wavelength of reflected wave form is adjusted to a short wavelength side by reducing the average particle diameter of silica particles, or reducing abundance-ratio of number of silica particles of secondary layer with respect to number of silica particles of primary layer.    DESCRIPTION OF DRAWING(S) - The drawing shows a schematic view of antireflective material.    Base material (1)    Binder layer (2)    Layer silica particles (3a,3b)    Air pockets (4a,4b)