NOVELTY - The apparatus (50) has a light source (64) provided for illuminating photovoltaic device. A probe head assembly (60) is provided with probes arranged in grid, so that given pair of probes corresponds to respective one of discrete areas within grid. The probes and device are positioned, so that probes contact the back contact layer. A controller e.g. computer (72) is provided for directing positioning of probes into contact with photovoltaic device, to activate light source, and to receive information from probes generated, when light source is activated.    USE - Apparatus for evaluating characteristics of photovoltaic device with exposed back contact layer having discrete areas arranged in grid.    ADVANTAGE - The photovoltaic device is provided with cells created by portions of the scribes arranged in series. The scribes can effectively destroy or impair the ability of device to function as the photovoltaic device without additional electrical connections. Thus the present apparatus can be considered the destructive testing system for use in evaluating the qualities of photovoltaic devices created in the assembly line not necessarily for forming devices that can be used commercially unless the devices can be altered in some way to account for the additional electrical isolation. The individual grid areas can be tested for efficiency, voltage, current, fill factor, series and shunt resistance. Instead of monolithically testing the entire photovoltaic device, by testing the individual areas more can be learned about the uniformity of the device and accordingly manufacturing accuracy. Using the head assembly with the number of probes and the photovoltaic device is cross-scribed to electrically isolate portions, so as to avoid cross-talk, virtually any characteristic that can be measured based on light impinging on the device can also be measured in the grid, thus the localized information as well as information as to uniformity across the entire device can be provided.    DETAILED DESCRIPTION - An INDEPENDENT CLAIM is included for a method for evaluating characteristics of photovoltaic device with exposed back contact layer.    DESCRIPTION OF DRAWING(S) - The drawing shows a perspective view of the apparatus for evaluating characteristics of the photovoltaic device with the probe head in the retracted position before placement of the photovoltaic device.    Apparatus for evaluating characteristics of photovoltaic device (50)    Probe head assembly (60)    Light source (64)    Actuator (69)    Computer (72)