NOVELTY - An electronic device consists of a gas-barrier film (F) obtained by laminating gas-barrier layer (2) and protective layer (3) on a resin base material (1). The gas barrier layer contains carbon atoms, silicon atoms, and oxygen atoms. The relationship between distance from the surface of gas barrier layer in thickness direction, and atomic ratio of carbon atoms is expressed by carbon distribution curve. The average atomic ratio of each atom in 90% or more regions of gas-barrier layer has magnitude correlation (I) or (II).    USE - Electronic device is used as organic electroluminescent panel used for organic electroluminescent device, and solar cell element and liquid crystal display device element.    ADVANTAGE - The electronic device has excellent gas-barrier property, flexibility, adhesiveness, durability, hardness, planarity, dark spot tolerance, and damage-proof property, even in high temperature and humidity environment.    DETAILED DESCRIPTION - An electronic device consists of a gas-barrier film obtained by laminating gas-barrier layer and protective layer on a resin base material. The gas-barrier layer contains carbon atoms, silicon atoms, and oxygen atoms. The composition of gas-barrier layer changes continuously with respect to layer thickness direction. The protective layer has a film hardness of 2-8 GPa, as measured by nano-indentation method. The relationship between distance from the surface of gas barrier layer in the layer thickness direction, and atomic ratio of carbon atoms with respect to total amount (100 atomic%) of carbon atoms, silicon atoms, and oxygen atoms, is expressed by a carbon distribution curve. The difference between largest extreme value (local maximum) and minimum extreme value (local minimum) of the ratio of carbon atoms is 5 atomic% or more, when measured among distribution curves of each element based on element distribution measurement of gas-barrier layer in a depth direction by X-ray photoelectron spectroscopy. The average atomic ratio of each atom with respect to total amount of silicon atoms, oxygen atoms, and carbon atoms in 90% or more regions of gas-barrier layer in whole layer thickness has magnitude correlation of formula: (carbon average atomic ratio) less than (silicon average atomic ratio) less than (oxygen average atomic ratio) (I) or (oxygen average atomic ratio) less than (silicon average atomic ratio) less than (carbon average atomic ratio) (II). An INDEPENDENT CLAIM is included for manufacture of electronic device.    DESCRIPTION OF DRAWING(S) - The drawing shows the schematic view of the electronic device.    Resin base material (1)    Gas-barrier layer (2)    Protective layer (3)    Anode (4)    Gas-barrier film (F)