NOVELTY - The plate has a chip substrate comprising apertures, and a thin film layer attached to a top surface of the chip substrate, where the thin film layer comprises phase plate holes aligned with the apertures, and diameter of each of the phase plate holes is smaller than that of each of the apertures. The chip substrate is fabricated from a wafer. A conductive layer is coated on surfaces of the chip substrate. The surfaces of the chip substrate comprise the top surface, a bottom surface of the substrate and inner wall surfaces of the apertures.    USE - On-chip thin film Zernike phase plate for use in a commercial transmission electron microscopy (TEM) system in biological fields for releasing charging resulted from electron beam bombardment and observing organic material such as polymer samples and unstained bio-specimen (all claimed) e.g. poly3-hexylthiophene/phenyl-C61-butyric acid ethyl ester polymer solar cell specimens, of an organic device such as bulk heterojunction polymer solar cell and organic LED (OLED).    ADVANTAGE - The chip fabricated and cut out from the wafer is combined with the existing Zernike carbon phase plate, so that the charging accumulated in the phase plate can be effectively released to routinely using the plate in the TEM system and prolong service life, and the reliable and stable system provides steady performance, allows reliable in-focus TEM images of organic materials with enhanced contrast to be routinely obtained, and allows a user to recognize and verify an unexpected nano-phase in polymer solar cell samples of in-device thickness, and observe fine structures of bio-specimens without staining using the stable TEM phase imaging technique, thus improving stability of the on-chip phase plate. The phase plate chip has low cost, and can be easily loaded, so that the phase plate is served as a disposable phase plate if used for cryo-EM where contamination is likely to be severe.    DETAILED DESCRIPTION - The chip substrate is a 14 mmx6 mm Si-based chip substrate. An INDEPENDENT CLAIM is also included for a method for observing organic material by a transmission electron microscope.    DESCRIPTION OF DRAWING(S) - The drawing shows a top view and a cross-sectional view of an on-chip Zernike thin film phase plate of an on-chip thin film Zernike phase plate system.